| Autor: |
Izmailov, V. V., Novoselova, M. V. |
| Zdroj: |
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Aug2022, Vol. 16 Issue 4, p618-625, 8p |
| Abstrakt: |
We substantiate the applicability of the stationary random process model to the subroughness (nanoroughness) profile of technical surfaces. The normality of the distribution of the nanoroughness-profile ordinates is verified by means of Pearson and Lilliefors goodness-of-fit tests. We calculate the autocorrelation functions and the spectral densities of the processes under study, as well as the correlation interval and the effective spectrum width. The examples show the possibility of calculating the surface nanoroughness-profile parameters on the basis of the autocorrelation function. The calculated parameter values coincide with those experimental within the error. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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