Correlative Approach for Atom Probe Sample Preparation of Interfaces Using Plasma Focused Ion Beam Without Lift-Out.
| Autor: | Rielli, Vitor Vieira, Theska, Felix, Primig, Sophie |
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| Zdroj: | Microscopy & Microanalysis; Aug2022, Vol. 28 Issue 4, p998-1008, 11p |
| Databáze: | Complementary Index |
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