| Autor: |
Hodges, Wyatt, Jarzembski, Amun, McDonald, Anthony, Ziade, Elbara, Pickrell, Greg W. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 6/28/2022, Vol. 131 Issue 24, p1-10, 10p |
| Abstrakt: |
A method is developed to calculate the length into a sample to which a Frequency Domain Thermoreflectance (FDTR) measurement is sensitive. Sensing depth and sensing radius are defined as limiting cases for the spherically spreading FDTR measurement. A finite element model for FDTR measurements is developed in COMSOL multiphysics and used to calculate sensing depth and sensing radius for silicon and silicon dioxide samples for a variety of frequencies and laser spot sizes. The model is compared to experimental FDTR measurements. Design recommendations for sample thickness are made for experiments where semi-infinite sample depth is desirable. For measurements using a metal transducer layer, the recommended sample thickness is three thermal penetration depths, as calculated from the lowest measurement frequency. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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