High resolution, non-contact surface metrology for freeform optics in digital immersive displays.
| Autor: | Sohn, Alex, Cardenas, Nelson, Naples, Neil, Colonna de Lega, Xavier C., Liesener, Jan C., Dresel, Thomas, de Groot, Peter |
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| Zdroj: | Proceedings of SPIE; 4/14/2022, Vol. 12137, p121370J-121370J-12, 1p |
| Databáze: | Complementary Index |
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