| Autor: |
Zhilova, O. V., Pankov, S. Yu., Makagonov, V. A., Kashirin, M. A., Remizova, O. I. |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 6/10/2022, Vol. 2466 Issue 1, p1-4, 4p |
| Abstrakt: |
The multilayered ZnO/SnO2 thin films were obtained by ion-beam sputtering. The dependence of the structure, morphology and electrical properties on the thickness of thin films has been established. The effect of heat treatment on the stability of the structure, phase composition, and electrical properties of the samples has been investigated. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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