| Autor: |
Werner, Wolfgang S.M., Helmberger, Fabian, Schürrer, Manuel, Eisenmenger‐Sittner, Christoph, Ridzel, Olga Y. |
| Předmět: |
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| Zdroj: |
Surface & Interface Analysis: SIA; Jul2022, Vol. 54 Issue 7, p681-687, 7p |
| Abstrakt: |
Reflection electron energy loss spectra (REELS) were measured for five insulating organic compounds: Kapton, polyethylene (PE), poly(methyl methacrylate) (PMMA), polystyrene (PS) and polytetrafluoroethylene (PTFE), as well as for Ni and Si, in the energy range between 200 and 1600 eV. The average number of surface excitations for a single surface crossing were determined from the experimental data and were found to be considerably smaller than for earlier studied materials, which mainly consisted of elemental metals [Surf. Sci. 486(2001)L461]. The surface excitation parameter, a material parameter used to quantify the relative intensity of surface losses in (photo)electron spectroscopy, was extracted from the data and compared with values found in the literature. The results indicate that surface excitations only have a minor influence on quantification of XPS spectra of polymers. On the other hand, a correction for surface excitations turns out to be essential for measurements of the electron inelastic mean free path of polymers when a metal is used as reference material. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
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