A General gm/ID Temperature-Aware Design Methodology Using 180 nm CMOS up to 250 ◦C.
| Autor: | Martins, João R. R. O., Alves, Francisco, Ferreira, Pietro M. |
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| Zdroj: | Journal of Integrated Circuits & Systems; 2022, Vol. 17 Issue 1, p1-9, 9p |
| Databáze: | Complementary Index |
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