| Autor: |
Ho, Linda Lee, Quinino, Roberto Costa, Fernandes, Fidel Henrique, Bourguignon, Marcelo |
| Předmět: |
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| Zdroj: |
Quality & Reliability Engineering International; Jun2022, Vol. 38 Issue 4, p1750-1759, 10p |
| Abstrakt: |
Most of the papers found in the literature concerned monitoring a process mean of a quality characteristic normally distributed. However, in several practical situations (like in reliability studies), the engineering team also desires to monitor a process mean in which the quality characteristic follows other probabilistic distributions, such as the Weibull. In this paper, we monitor a process mean of a random variable following a Weibull distribution using the traditional X¯$\overline{X}$ control chart. To improve the performance, Klein's two of two supplementary run rule is included in the X¯$\overline{X}$ chart. Such adoption promotes better performance, producing faster signals of abnormal situations (in terms of average run length) than the traditional X¯$\overline{X}$ chart in a great variety of shifts. An empirical example illustrates the proposed scheme. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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