| Autor: |
Barak, J., Haran, A., Adler, E., Azoulay, M., Levinson, J., Zentner, A., David, D., Fischer, B. E., Heiss, M., Betel, D. |
| Předmět: |
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| Zdroj: |
IEEE Transactions on Nuclear Science; Dec2004 Part 2 of 3, Vol. 51 Issue 6, p3486-3493, 8p |
| Abstrakt: |
Single-event upset (SEU) cross section was measured for several devices under reduced bias with light ions, in particular α-particles. The results show that α-particles can be used, in a simple manner, for testing devices in order to save accelerator time. A proportionality law was found for scaling the reduced bias results to normal operation bias. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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