Autor: |
Puzanov, A. S., Bibikova, V. V., Zabavichev, I. Yu., Obolenskaya, E. S., Potekhin, A. A., Tarasova, E. A., Vostokov, N. V., Kozlov, V. A., Obolensky, S. V. |
Předmět: |
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Zdroj: |
Semiconductors; Oct2021, Vol. 55 Issue 10, p780-784, 5p |
Abstrakt: |
Theoretical analysis of the degradation of the current–voltage characteristic and transient ionization processes occurring in a low-barrier uncooled GaAs Mott diode under the action of heavy ions from outer space and laser pulses simulating them is carried out. The response of the diode to the action of an arsenic ion with an energy of 200 MeV, which corresponds to a linear energy transfer of 26 MeV cm2/mg, is compared with the response to the action of femtosecond optical-radiation pulses with a duration of 10 fs at wavelengths of 870 and 670 nm. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
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