| Autor: |
Tan, Nongchao, Wu, Ping, Hua, Ye, Sun, Jun, Cao, Yibing, Zhang, Guangshuai, Huang, Wenhui, Huang, Wenhua |
| Zdroj: |
Laser & Particle Beams; 2/15/2022, p1-10, 10p |
| Abstrakt: |
Radio frequency (RF) breakdown can result in pulse shortening and seriously degrade the stability and reliability of relativistic backward wave oscillators (RBWOs). This paper discusses the energy range of electrons causing breakdown traces in slow-wave structures (SWSs) through particle-in-cell (PIC) simulation, numerical calculation, and experimental verification. The PIC simulation and numerical calculation results reveal that the energy of the majority of the field-induced electrons bombarding the SWS surfaces after being accelerated is less than 120 keV. Furthermore, the micro appearances of the breakdown traces in SWSs and the witness targets bombarded directly by electrons of various energy levels have been analyzed. Scanning electron microscope (SEM) shows that the breakdown traces are featured with corrugated morphologies with a wide range and a shallow depth. A mass of craters emerge in the vicinity of the corrugated morphologies. These appearances are quite similar to destructive traces impacted directly by low-energy electrons (around 160 keV). Thus, it is confirmed that the breakdown traces result from the bombardment of low-energy electrons. Therefore, the breakdown mechanism of field-emitted electrons impacting on the structure surfaces in RBWOs has been further improved. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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