| Autor: |
Silva, Leandro Alves da, Ho, Linda Lee, Quinino, Roberto Costa |
| Předmět: |
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| Zdroj: |
Quality & Reliability Engineering International; Mar2022, Vol. 38 Issue 2, p877-886, 10p |
| Abstrakt: |
First, the npx$np_x$‐type attribute control charts have been proposed to monitor the process mean. The main contribution of this paper is to show the good performances of the "pure npx$np_x$" (shortly npxσ2$np_{x}^{\sigma ^2}$) and "improved npx$np_x$" (shortly npx(I)σ2$np_{x(I)}^{\sigma ^2}$) attribute charts to monitor the variance. The results confirmed that they are also good alternatives to S2$S^2$ control chart. To have an equal performance (in terms of speed to detect abnormal cases), the sample size needed for these charts is slightly higher than those practiced for an S2$S^2$ control chart. This is an advantage since an attribute inspection is faster and cheaper as no measurements on the examined units are taken (mainly if we are dealing with destructive experiments). A numerical example illustrates our proposal. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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