| Autor: |
Ivaškevičiūtė-Povilauskienė, R., Paddubskaya, A., Seliuta, D., Jokubauskis, D., Minkevičius, L., Urbanowicz, A., Matulaitienė, I., Mikoliūnaitė, L., Kuzhir, P., Valušis, G. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 1/21/2022, Vol. 131 Issue 3, p1-9, 9p |
| Abstrakt: |
It was demonstrated that optical modulation together with simultaneous terahertz (THz) imaging application enables an increase in contrast by an order of magnitude, thereby illustrating the technique as a convenient contactless tool for characterization of graphene deposited on high-resistivity silicon substrates. It was shown that the single- and double-layer graphene can be discriminated and characterized via variation of THz image contrast using a discrete frequency in a continuous wave mode. Modulation depth of 45% has been reached, and the contrast variation from 0.16 up to 0.23 is exposed under laser illumination for the single- and double-layer graphene, respectively. The technique was applied in the development and investigation of graphene-based optical diffractive elements for THz imaging systems. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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