| Autor: |
Petrzhik, A. M., Shadrin, A. V., Kislinskii, Yu. V., Constantinian, K. Y., Ovsyannikov, G. A., Christiani, G., Logvenov, G. |
| Zdroj: |
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Nov2021, Vol. 15 Issue 6, p1361-1364, 4p |
| Abstrakt: |
We report the fabrication of an epitaxial grown thin-film heterostructure YBa2Cu3O7–x/ PrNiO3/YBa2Cu3O7–x with a 6 nm thick praseodymium nickelate (PrNiO3) interlayer. X-ray diffraction studies demonstrate that obtained patterns of both the upper and bottom YBa2Cu3O7–x films, as well as PrNiO3, are in good agreement with the lattice parameters of materials. Measurements of the resistive characteristics show that, with decreasing temperature, the voltage dependence of the conductivity G(V) deviates from the symmetric, becoming noticeable at T = 77 K, a temperature lower than the critical temperature of the cuprate superconductor YBa2Cu3O7–x. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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