| Autor: |
Zhang, Dongxu, Dong, Haopeng, Lou, Yuanfu, Zhong, Yongqiang, Li, Fangfang, Fu, Xiaoguo, Zheng, Yuxiang, Li, Wenwu |
| Předmět: |
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| Zdroj: |
AIP Advances; Nov2021, Vol. 11 Issue 11, p1-6, 6p |
| Abstrakt: |
Optical properties of the UO2+x film deposited by a polymer-assisted deposition method have been investigated by spectroscopic ellipsometry (SE). This epitaxial film contains at least two kinds of uranium oxides of U3O8 and UO3, and the O/U ratio is 2.74, which is confirmed by x-ray diffraction (XRD) and scanning Auger microscopy methods. By investigating the optical constants, the bandgaps of U3O8 and UO3 are determined as 2.3 and 1.0 eV, respectively, and 80% of the epitaxial film is U3O8 and 20% is UO3. The speciation signatures from the XRD and band structures show that the UO2+x epitaxial film reduced to U3O8 with the heating treatment at 480 K in a vacuum while oxidized to UO3 at 650 K. This work demonstrates a useful tool for studying the optical properties, band structures, and phase transition of uranium oxide film by SE. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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