| Autor: |
Chen, Wen-Chung, Tan, Yung-Fang, Lin, Shih-Kai, Zhang, Yong-Ci, Chang, Kai-Chun, Lin, Yun-Hsuan, Yeh, Chien-Hung, Wu, Chung-Wei, Yeh, Yu-Hsuan, Wang, Kao-Yuan, Huang, Hui-Chun, Tsai, Tsung-Ming, Huang, Jen-Wei, Chang, Ting-Chang |
| Předmět: |
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| Zdroj: |
IEEE Transactions on Electron Devices; Aug2021, Vol. 68 Issue 8, p3838-3842, 5p |
| Abstrakt: |
The HfZrOx (HZO) ferroelectric material is a promising material for ferroelectric memory and is compatible with the semiconductor process for ferroelectric random access memory (FeRAM) and negative capacitance field effect transistor. However, defects often exist in the grain boundary to influence the performance or reliability of devices. In addition, uniformity between devices must be considered when they are mass-produced. Therefore, the grain size will become important in determining the performance and reliability. In this study, we use electrical measurements of current–voltage, capacitance–voltage, and polarization–voltage measurements to test high- and low-temperature deposition devices, with a transmission electron microscope (TEM) image to confirm the grain size. Finally, we propose a model to explain the phenomenon and provide a method to obtain better ferroelectric memory. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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