Structure and crystallization of an amorphous film of variable thickness Bi2Te3 with a copper sublayer under the action of an electron beam in TEM.

Autor: Kolosov, V. Yu., Yushkov, A. A.
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Zdroj: AIP Conference Proceedings; 2021, Vol. 2441/2338 Issue 1, p1-7, 7p
Abstrakt: Nanothin films of bismuth telluride Bi2Te3 were obtained by thermal sputtering in vacuum on a mica substrate with amorphous carbon and a copper sublayer. A sample with a specially created sharp thickness gradient was studied by transmission electron microscopy (TEM). An island-labyrinth structure of the film was revealed, with the size of islands in the range of about 7-25 nm. The film is amorphous at the beginning of the thickness gradient; in the studied regions of greater thickness, it crystallizes in the rhombohedral Bi2Te3 phase. High-resolution TEM has revealed crystallization of initially amorphous islands under the action of a focused electron beam of increased intensity in an electron microscope column. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index