Correlation analysis of vibration modes in physical vapour deposited Bi2Se3 thin films probed by the Raman mapping technique.
| Autor: | Niherysh, K. A., Andzane, J., Mikhalik, M. M., Zavadsky, S. M., Dobrokhotov, P. L., Lombardi, F., Prischepa, S. L., Komissarov, I. V., Erts, D. |
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| Zdroj: | Nanoscale Advances; 11/21/2021, Vol. 3 Issue 22, p6395-6402, 8p |
| Databáze: | Complementary Index |
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