STEM-in-SEM highly deformed structure investigation with focus on electron-transparent specimen preparation.
| Autor: | Nowakowski, Pawel, Bonifacio, Cecile, Wiezorek, Jörg, Ray, Mary, Fischione, Paul |
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| Zdroj: | Microscopy & Microanalysis; 2021 Supplement 1, Vol. 27, p1604-1607, 4p |
| Databáze: | Complementary Index |
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