Evaluation of fullerenes C60/C70 layers in polystyrene thin films by neutron and X-ray reflectometry.

Autor: Tropin, Timur V., Karpets, Maksym L., Kosiachkin, Yehor, Gapon, Igor V., Gorshkova, Yulia E., Aksenov, Victor L.
Předmět:
Zdroj: Fullerenes, Nanotubes & Carbon Nanostructures; 2021, Vol. 29 Issue 10, p819-824, 6p
Abstrakt: Thin films of polystyrene-fullerene C60 and C70 nanocomposites are investigated by X-ray, neutron reflectometry and AFM. These films were prepared by spin coating from toluene solutions with fullerene content of 1, 3, and 5 wt % relative to polystyrene mass. The concomitant to spin-coating formation of aggregates, larger for C70, was observed. Still, a formation of an enriched layer of fullerenes with a thickness up to 5 nm was detected after model fitting of the reflectivity curves. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index