| Autor: |
Devyaterikov, D. I., Kravtsov, E. A., Proglyado, V. V., Zhaketov, V. D., Nikitenko, Yu. V. |
| Zdroj: |
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; May2021, Vol. 15 Issue 3, p542-548, 7p |
| Abstrakt: |
In this paper, the results of investigating thin films of rare-earth helimagnetics (REMs) Dy and Ho by polarized neutron reflectometry are presented. It is shown that the growth by magnetron sputtering of rare-earth structures on sapphire substrates with a buffer layer Nb Al2O3||[110]Nb|| leads to complete relaxation of the Nb crystal lattices and the rare-earth film. It is found that some magnetic phase transitions typical of bulk Dy and Ho are not observed in 200 nm [0001]R thin films or are observed in a modified form. Differences between the Néel and Curie temperatures of thin REM films compared to bulk REMs are determined based on polarized-neutron-reflectometry data and measurements of the temperature dependence of the magnetization in the sample plane. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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