Quantifying thermal transport in buried semiconductor nanostructures via cross-sectional scanning thermal microscopy.
| Autor: | Spiεave;ce, Jean, Evangeli, Charalambos, Robson, Alexander J., El Sachat, Alexandros, Haenel, Linda, Alonso, M. Isabel, Garriga, Miquel, Robinson, Benjamin J., Oehme, Michael, Schulze, Jörg, Alzina, Francesc, Sotomayor Torres, Clivia, Kolosov, Oleg V. |
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| Zdroj: | Nanoscale; 6/28/2021, Vol. 13 Issue 24, p10829-10836, 8p |
| Databáze: | Complementary Index |
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