| Autor: |
Mirsaleh-Kohan, Nasrin, Esmaili, Sasan, Bass, Andrew D., Huels, Michael A., Sanche, Leon |
| Předmět: |
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| Zdroj: |
Journal of Chemical Physics; 6/14/2021, Vol. 154 Issue 22, p1-14, 14p |
| Abstrakt: |
We have employed electron stimulated desorption (ESD) and x-ray photoelectron spectroscopy (XPS) to study the chemical species generated from multilayer films of N2O, C2D2, and mixtures thereof (i.e., N2O/C2D2) by the impact of low energy electrons with energies between 30 and 70 eV. Our ESD results for pure films of N2O show the production of numerous fragment cations and anions, and of larger molecular ions, of sufficient kinetic energy to escape into vacuum, which are likely formed by ion–molecule scattering in the film. Ion–molecule scattering is also responsible for the production of cations from C2D2 films that contain as many as six or seven carbon atoms. Many of the same anions and cations desorb from N2O/C2D2 mixtures, as well as new species, which is the result of ion–molecule scattering in the film. Anion desorption signals further indicate the formation of C–N containing species within the irradiated films. XPS spectra of N1s, C1s, and O1s lines reveal the fragmentation of N–O bonds and gradual formation of molecules containing species containing O–C=O, C=O, and C–O functional groups. A comparison between ESD and XPS findings suggests that species observed in the ESD channel are primarily products of reactions taking place at the film–vacuum interface, while those observed in the XPS derive from reactions occurring within the solid. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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