Gis-Based Fire Risk Spatial Assessment for Semiconductor Plant.
Autor: | Li, Hongga, Huang, Xiaoxia |
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Zdroj: | IOP Conference Series: Earth & Environmental Science; 2021, Vol. 772, p1-6, 6p |
Databáze: | Complementary Index |
Externí odkaz: |
Autor: | Li, Hongga, Huang, Xiaoxia |
---|---|
Zdroj: | IOP Conference Series: Earth & Environmental Science; 2021, Vol. 772, p1-6, 6p |
Databáze: | Complementary Index |
Externí odkaz: |