| Autor: |
El-Falou, Abdallah, Camlica, Ahmet, Mohammadi, Reza, Levine, Peter M., Karim, Karim S. |
| Předmět: |
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| Zdroj: |
IEEE Transactions on Electron Devices; Apr2021, Vol. 68 Issue 4, p1746-1752, 7p |
| Abstrakt: |
We report on the design and characterization of a monolithic single-photon-counting (SPC) X-ray detector integrating an amorphous semiconductor sensor. Our prototype combines amorphous selenium (a-Se), a well-known photoconductor, with a CMOS readout integrated circuit (ROIC) containing two 26 × 196 arrays of single-energy-threshold pixels. We achieve high spatial resolution for capturing single 60-keV photons by implementing 11.4-μm-pitch pixels and by integrating a 70-μm-thick a-Se sensor on the ROIC. We present experimental SPC results using a mono-energetic 60-keV radioactive source. Our results also suggest that our prototype a-Se/CMOS detector leverages the small-pixel effect (SPE) due to the large ratio of a-Se thickness to pixel pitch. This effect could overcome the slow inherent transient response of a-Se for high count rate X-ray diagnostic applications like mammography. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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