| Autor: |
Dressler, O., Feikes, J., Kuske, P., Kuszynski, J. |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2004, Vol. 732 Issue 1, p262-267, 6p |
| Abstrakt: |
Complex machines like synchrotron light sources or newly proposed Free Electron Lasers (FEL) posses a variety of coupled parameters that need complex optimization procedures to achieve best possible working conditions. A programming tool like LabVIEW, with its emphasis on easy data acquisition and its very high flexibility, is used extensively to simultaneously access diverse measurement instruments like Scopes, Spectrum Analyzers, and Waveform Generators and combine them into measurement routines which can access all process variables available under EPICS. © 2004 American Institute of Physics [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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