Development of Residual Gas Profile Monitors at GSI.

Autor: Giacomini, T., Barabin, S., Forck, P., Liakin, D., Skachkov, V.
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Zdroj: AIP Conference Proceedings; 2004, Vol. 732 Issue 1, p286-293, 8p
Abstrakt: Beam profile measurements at modern ion synchrotrons and storage rings require high timing performances on a turn-by-turn basis. High spatial resolutions are essential for cold beams and beamwidth measurings. The currently used RGM supported very interesting measurements and applications. Due to the readout technology the spatial and time resolution is limited. To meet the expanded demands a more comprehensive device is under development. It will be an all-purpose residual gas monitor to cover the wide range of beam currents and transversal particle distributions. Due to the fast profile detection it will operate on primary electrons after residual gas ionization. A magnetic field of 100 mT binds them to the ionization point inside 0.1-mm orbits. The high-resolution mode will be read out by a digital CCD camera with an upstream MCP-phosphor screen assembly. It is planned to read out the fast turn-by-turn mode by an array of 100 photodiodes with a resolution of 1 mm. Every photodiode is equipped with an amplifier-digitizer device providing a frame rate of ∼ 10 MSamples/s. © 2004 American Institute of Physics [ABSTRACT FROM AUTHOR]
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