| Autor: |
Blum, Thomas, Graves, Jeffery, Zachman, Michael J., Polo‐Garzon, Felipe, Wu, Zili, Kannan, Ramakrishnan, Pan, Xiaoqing, Chi, Miaofang |
| Předmět: |
|
| Zdroj: |
Small Methods; May2021, Vol. 5 Issue 5, p1-7, 7p |
| Abstrakt: |
Forming an ultra‐thin, permeable encapsulation oxide‐support layer on a metal catalyst surface is considered an effective strategy for achieving a balance between high stability and high activity in heterogenous catalysts. The success of such a design relies not only on the thickness, ideally one to two atomic layers thick, but also on the morphology and chemistry of the encapsulation layer. Reliably identifying the presence and chemical nature of such a trace layer has been challenging. Electron energy‐loss spectroscopy (EELS) performed in a scanning transmission electron microscope (STEM), the primary technique utilized for such studies, is limited by a weak signal on overlayers when using conventional analysis methods, often leading to misinterpreted or missed information. Here, a robust, unsupervised machine learning data analysis method is developed to reveal trace encapsulation layers that are otherwise overlooked in STEM‐EELS datasets. This method provides a reliable tool for analyzing encapsulation of catalysts and is generally applicable to any spectroscopic analysis of materials and devices where revealing a trace signal and its spatial distribution is challenging. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
|
Plný text