Edge placement error wafer mapping and investigation for improvement in advanced DRAM node.

Autor: Adan, Ofer, Robinson, John C., Chen, Kuan-Ming, Henke, Wolfgang, Jung, Ji-Hoon, Kasperkiewicz, Ewa, Bouma, Anita, Rahman, Rizvi, Isai, Gratiela, Kim, Gwang-Gon, Tsiachris, Sotirios, Yoo, Jae-Doug, Park, Yuna, Park, JaeYoung, Won, Jonggeun, Oh, Nang-Lyeom, Chen, Hsin-Yu, Lin, WeiTai, Hsieh, Chih-Hung, Pao, Kuo-Feng
Zdroj: Proceedings of SPIE; 11/4/2020, Vol. 11611, p116111V-116111V-11, 1p
Databáze: Complementary Index