| Autor: |
Dumont, M., Lisart, M., Maurine, P. |
| Předmět: |
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| Zdroj: |
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Apr2021, Vol. 40 Issue 4, p680-693, 14p |
| Abstrakt: |
Electromagnetic fault injection (EMFI) has recently gained popularity as a mean to induce faults because of its inherent advantages. Despite this popularity, there is only a little information on how EMFI generates faults. Within this context, this article aims at filling this lack by proposing a complete understanding and modeling of EM induction on integrated circuits (ICs). The presented model is confronted to experiments to endorse its soundness. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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