A Combination Method of Charge Density Measurement in Hard Materials Using Accurate, Quantitative Electron and X-ray Diffraction: The α-Al2O3 Case.
| Autor: | Victor A. Streltsov, Philip N.H. Nakashima, Andrew W.S. Johnson |
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| Zdroj: | Microscopy & Microanalysis; Oct2003, Vol. 9 Issue 5, p419-427, 9p |
| Databáze: | Complementary Index |
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