Characterization of Copper Surfaces Used in Electronic Circuit Boards by Reflectance FT-IR.
| Autor: | Sloan, James M., Pergantis, Charles G. |
|---|---|
| Zdroj: | MRS Online Proceedings Library; 1999, Vol. 591 Issue 1, p271-275, 5p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
Full text from SpringerLink