| Autor: |
Peng, Xu, Zhanqi, Xu, Wanru, Dong, Yong-fei, Li, Jian, Yang, Heren, Gui, Liuyue, Yin, Haifeng, Hu, Yu, Jiang, Zhongzheng, Yang |
| Předmět: |
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| Zdroj: |
SID Symposium Digest of Technical Papers; Feb2021 Supplement S1, Vol. 52, p669-669, 1p |
| Abstrakt: |
This article studied the influence factor of highlight issues that existed in trace area in the flexible displays. The reason of highlight issues was OC was corroded by etch agent due to poor OC chemical resistance. We solved the highlight issues by means of changing the OC material, optimizing the manufacturing process of OC film, cutting down the ITO etching time, and adding the ITO etching anneal process. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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