Structural and Electronic Properties of Hydrogenated Nanocrystalline Silicon Films Made with Hydrogen Dilution Profiling Technique.

Autor: Wang, Keda, Han, Daxing, Williamson, D. L., Huie, Brittany, Weinberg-Wolf, J. R., Yan, Baojie, Yang, Jeffrey, Guha, Subhendu
Zdroj: MRS Online Proceedings Library; 2005, Vol. 862 Issue 1, p1-6, 6p
Databáze: Complementary Index
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