STM characterization of Cu thin films grown by direct ion deposition.

Autor:	Pomeroy, Joshua M., Couture, Aaron, Jacobsen, Joachim, Hill, Colin C., Sethna, James P., Cooper, Barbara H., Brock, Joel D.
Zdroj:	MRS Online Proceedings Library; 2000, Vol. 648 Issue 1, p1-6, 6p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu Full text from SpringerLink