Retardation of the oxidation of aluminum thin films in low-oxygen and cryogenic environments.

Autor: Navarro, Ramón, Geyl, Roland, Hart, S. Merlin, Smith, Donovan K., Allred, David D.
Zdroj: Proceedings of SPIE; 5/28/2020, Vol. 11451, p1145149-1145149, 1p
Databáze: Complementary Index