Time-Dependent Bias Stress-Induced Instability of SiC MOS Devices.
| Autor: | Lelis, Aivars, Habersat, Daniel, Olaniran, Fatimat, Simons, Brian, McGarrity, James, McLean, F. Barry, Goldsman, Neil |
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| Zdroj: | MRS Online Proceedings Library; 2006, Vol. 911 Issue 1, p1-6, 6p |
| Databáze: | Complementary Index |
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