Demonstration of Hybrid Silicon-on-Silicon Carbide Wafers and Electrical Test Structures with Improved Thermal Performance.

Autor:	Whipple, Steven G., Torvik, John T., Treece, Randolph E., Bernacki, Jeffrey T.
Zdroj:	MRS Online Proceedings Library; 2006, Vol. 911 Issue 1, p1-6, 6p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu Full text from SpringerLink