Simulation of Forescattered Electron Channeling Contrast Imaging of Threading Dislocations Penetrating SiC Surfaces.

Autor: Twigg, Mark E., Picard, Yoosuf N., Caldwell, Joshua D., Eddy, Charles R., Neudeck, Philip G., Trunek, Andrew J., Powell, J. Anthony
Zdroj: MRS Online Proceedings Library; 2008, Vol. 1068 Issue 1, p1-6, 6p
Databáze: Complementary Index
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