Thickness-fringe Contrast Analysis of Defects in GaN.

Autor:	Farrer, Jeffrey K., Carter, C. Barry, Mao, Z., McKernan, Stuart
Zdroj:	MRS Online Proceedings Library; 2001, Vol. 673 Issue 1, p1-6, 6p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu Full text from SpringerLink