Microscopic Characterization of Polycrystalline APCVD CdTe Thin Film PV Devices.

Autor: Ohno, Tim R., Sutter, Eli, Kestner, James M., Gilmore, A. S., Kaydanov, Victor, Wolden, Colin A., Meyers, Peter V., Woods, Lawrence, Romero, Manuel J., Al-Jassim, M. M., Johnston, Steve
Zdroj: MRS Online Proceedings Library; 2001, Vol. 668 Issue 1, p1-6, 6p
Databáze: Complementary Index
Externí odkaz: