Extended Defects in 4H-SiC PiN Diodes.

Autor: Twigg, M. E., Stahlbush, R. E., Fatemi, M., Arthur, S. D., Fedison, J. B., Tucker, J. B., Wang, S.
Zdroj: MRS Online Proceedings Library; 2002, Vol. 742 Issue 1, p1-6, 6p
Databáze: Complementary Index
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