Interactions of Point Defects and Impurities With Open Volume Defects in Silicon.

Autor:	Williams, J. S., Ridgway, M. C., Conway, M. J., Wong-Leung, J., Williams, B. C., Petravic, M., Fortuna, F., Ruault, M. O., Bernas, H.
Zdroj:	MRS Online Proceedings Library; 2000, Vol. 647 Issue 1, p1-11, 11p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu Full text from SpringerLink