Comparison of Conductance and Capacitance techniques for Measurement of Interface States in Thin Oxides.

Autor:	Higman, T. K.
Zdroj:	MRS Online Proceedings Library; 2001, Vol. 670 Issue 1, p1-7, 7p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu Full text from SpringerLink