Characterization and Mapping of Crystal Defects in Silicon Carbide.
| Autor: | Emorhokpor, E., Kerr, T., Zwieback, I., Elkington, W., Dudley, M., Anderson, T., Chen, J. |
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| Zdroj: | MRS Online Proceedings Library; 2004, Vol. 815 Issue 1, p136-140, 5p |
| Databáze: | Complementary Index |
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