Combined Application of Section and Projection Topography to Defect Analysis in PVT-Grown 4H-SiC.
| Autor: | Wang, H., Wu, F., Byrappa, S., Shun, S., Raghothamachar, B., Dudley, M., Sanchez, E. K., Chung, G., Hansen, D., Mueller, S. G., Loboda, M. J. |
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| Zdroj: | MRS Online Proceedings Library; 2012, Vol. 1433 Issue 1, p77-82, 6p |
| Databáze: | Complementary Index |
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