Advancing the Hexapole Cs-Corrector for the Transmission Electron Microscope.
Autor: | Riedel, Thomas, Hartel, Peter, Linck, Martin, Gerheim, Volker, Müller, Heiko, Uhlemann, Stephan |
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Zdroj: | Microscopy & Microanalysis; 2020Supplement2, Vol. 26 Issue S2, p2150-2151, 2p |
Databáze: | Complementary Index |
Externí odkaz: |