Advancing the Hexapole Cs-Corrector for the Transmission Electron Microscope.

Autor: Riedel, Thomas, Hartel, Peter, Linck, Martin, Gerheim, Volker, Müller, Heiko, Uhlemann, Stephan
Zdroj: Microscopy & Microanalysis; 2020Supplement2, Vol. 26 Issue S2, p2150-2151, 2p
Databáze: Complementary Index