New EPMA-XRF Integration Allows Rapid Trace Element Analysis of Geological Materials.
| Autor: | Wakimoto, Rie, Yokoyama, Takaomi, Tsukamoto, Kazunori, Kato, Koki, Robertson, Vernon |
|---|---|
| Zdroj: | Microscopy & Microanalysis; 2020Supplement2, Vol. 26 Issue S2, p1882-1883, 2p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|