Monitoring the Conductivity of Thin Metal Layers During the Processes of Grain-growth and Dewetting, Using a Desktop FEG-SEM.
| Autor: | Bouman, AC, Jansen, Jacob, Griebling, M, Lammers, L, Santos Costa, VM, Vermeulen, JJA, Vervloat, JGA, Hammen, AFJ, Zandbergen, HW |
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| Zdroj: | Microscopy & Microanalysis; 2020Supplement2, Vol. 26 Issue S2, p1456-1457, 2p |
| Databáze: | Complementary Index |
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